Abstract
Kemp [Scand. Audiol. Suppl. 9, 35–47 (1979)] showed that local maxima and minima in auditory thresholds are reflected in low level suprathreshold measurementsuch as loudness and frequency discrimination. While studying masking with tones and broad-band noise, the author found that these maxima and minima (in earphone voltage) also affect masked thresholds. As masking levels and masked thresholds increase, the threshold differences decrease until the masked thresholds reach 40–50 dB SPL where no maxima and minima can be seen. The shape of psychophysical tuning curves can also be influenced by these maxima and minima leading to curves with more than one best frequency, with a flat tip or with the best frequency displaced away from the probe to the frequency of an adjacent minimum. [Work supported by NINCDS Grant NS 03856.]
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