Abstract
We have measured and analyzed the temperature and gate voltage dependencies of the field-effect mobility in organic thin-film transistors. We find that the mobility prefactor increases exponentially with the activation energy in agreement with the Meyer–Neldel rule. This behavior is demonstrated in the mobility data of solution-processed pentacene, poly(2,5-thienylene vinylene) and in mobility data reported in literature. Surprisingly, the characteristic Meyer–Neldel energy for all analyzed materials is close to 40 meV. Possible implications for the charge transport mechanism in these materials are discussed.
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