Abstract
The abnormal grain growth (AGG) in polycrystalline diamond (PCD) during high pressure-high temperature sintering (6 GPa; 1600 °C) was investigated. Some grains grew to a size of several hundreds of micrometers in PCD manufactured with 2-μm diamond powder. However, the AGG distribution was inhomogeneous possibly due to the inhomogeneous pressure distribution. When the initial average particle diameter of diamond powder was 4 μm, no AGG was observed within the experimental range (1 h) due to an increase in the diffusion distance. Electron backscattered diffraction technique was used to show that the abnormally grown grains were single crystals with and without their twins with the {1 1 1} twinning planes. The {1 1 1} faceted planes developed in the abnormally grown crystals, suggesting that AGG in PCD could be explained by the 2D nucleation mechanism.
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