Abstract
The Sira microscope image comparator has recently been applied to the assessment of typical defects in optical thin-film coatings, and the results of observations on a variety of typical defects are discussed and demonstrated. These indicate that the microscope image comparator is likely to be useful for quantifying defects in coatings of various types.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
