Abstract

The investigation on polarized scattering characteristic in the near-infrared band is a challenge to improve the reliability of target classification and identification, especially for high-temperature environment. In this paper, the in- and out-of-plane polarized BRDF of the rough alumina (commercial, 99 wt%) under variable temperature are measured for the first time considering the thermal radiation. The results indicate that the thermal radiation, wavelength and surface roughness have significant influence on the measuring result. The source of measuring error is analyzed in detail, and the overall error is not higher than 3.29%. In addition, the in- and out-of-plane polarized BRDF model is built, and the fitting results show that the calculated values are in satisfactory agreement with the measuring results. This work may be beneficial to the study of optical properties and applications of alumina.

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