Abstract

The magnetic resonance force microscope (MRFM) marries the techniques of magnetic resonance imaging (MRI) and atomic force microscopy (AFM), to produce a three-dimensional imaging instrument with high, potentially atomic-scale, resolution. The principle of the MRFM has been successfully demonstrated in numerous experiments. By virtue of its unique capabilities, the MRFM shows promise to make important contributions in fields ranging from three-dimensional materials characterization to bio-molecular structure determination. Here we focus on its application to the characterization and study of layered magnetic materials; the ability to illuminate the properties of buried interfaces in such materials is a particularly important goal. While sensitivity and spatial resolution are currently still far from their theoretical limits, they are nonetheless comparable to or superior to that achievable in conventional MRI. Further improvement of the MRFM will involve operation at lower temperature, application of larger field gradients, introduction of advanced mechanical resonators and improved reduction of the spurious coupling when the magnet is on the resonator.

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