Abstract
The MR (magnetoresistance) characteristics of metallic multilayer films are reported to be dependent on the method of preparation. Co/Cu multilayer films were prepared using a UHV evaporator. The MR characteristics were compared with those of sputtered films. Co/Cr multilayer films showed small-angle X-ray diffraction peaks and a large MR ratio of 15% at room temperature. However, NiFeCo/Cu multilayer films did not exhibit small-angle X-ray diffraction peaks, and their MR ratios were less than 2% at room temperature.
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