Abstract
A microprozessor-based picture analysis system for semiautomatic measurements in etched plastic nuclear track detectors was developed. The video pictures of particle tracks seen through a microscope are digitized. The software algorithm of pattern recognition, of picture improvement and the parameter calculation for the surface ellipses are described. With this system we analysed 410 MeV/nucleon 56 Fe tracks and achieved a charge resolution of 0.08 charge units per track.
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Schedule a callMore From: International Journal of Radiation Applications and Instrumentation. Part D. Nuclear Tracks and Radiation Measurements
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