The Kβ/Kα X-ray intensity ratios of Cu and Ag in Cu–Ag thin alloy films

Abstract

Kβ/Kα X-ray intensity ratio values of Cu and Ag in CuxAg1-x (x = 53.5, 67.6, 76.9, 85.4, 89.6) thin alloy films produced from two different sources by the physical vapour deposition method have been determined by the Energy Dispersive X-ray Fluorescence Spectroscopy (EDXRF) method. The changes in the crystal structures of CuxAg1-x thin alloy films caused by the changes in the Cu and Ag concentrations, which affect the valence electronic structure have been investigated by the X-ray Diffraction (XRD) techniques. The obtained values were compared with the theoretical and fitted values for pure Cu and Ag elements.