The JET diagnostic fast central acquisition and trigger system (abstract)

Abstract

Most plasma physics diagnostics sample at a fixed frequency that is normally matched to available memory limits. This technique is not appropriate for long pulse machines such as JET where sampling frequencies of hundreds of kHz are required to diagnose very fast events. As a result of work using real-time event selection within the previous JET soft x-ray diagnostic, a single data acquisition and event triggering system for all suitable fast diagnostics, the fast central acquisition and trigger system (Fast CATS), has been developed for JET. The front-end analog-to-digital conversion (ADC) part samples all channels at 250 kHz, with a 100 kHz pass band and a stop band of 125 kHz. The back-end data collection system is based around Texas Instruments TMS320C40 microprocessors. Within this system, two levels of trigger algorithms are able to evaluate data. The first level typically analyzes data on a per diagnostic and individual channel basis. The second level looks at the data from one or more diagnostics in a window around the time of interest flagged by the first level system. Selection criteria defined by the diagnosticians are then imposed on the results from the second level to decide whether that data should be kept. The use of such a system involving intelligent real time trigger algorithms and fast data analysis will improve both the quantity and quality of JET diagnostic data, while providing valuable input to the design of data acquisition systems for very long pulse machines such as ITER. This paper will give an overview of the various elements of this new system. In addition, first results from this system following the restart of JET operation will be presented.