Abstract
We demonstrate a tool for quantitative measurements in the extreme ultraviolet (EUV) spectral region measuring spatially resolved atomic ionization products at the focus of an EUV beam. The ionizing radiation is a comb of the 11th–15th harmonics of a Ti:Sapphire femtosecond laser beam produced in a Xenon gas jet. The spatial ion distribution at the focus of the harmonics is recorded using an ion microscope. Spatially resolved single- and two-photon ionization products of Argon and Helium are observed. From such ion distributions single- and two-photon generalized cross sections can be extracted by a self-calibrating method. The observation of spatially resolved two-EUV-photon ionization constitutes an initial step towards future single-shot temporal characterization of attosecond pulses.
Highlights
We demonstrate a tool for quantitative measurements in the extreme ultraviolet (EUV) spectral region measuring spatially resolved atomic ionization products at the focus of an Extreme Ultra Violet (EUV) beam
In this work we demonstrate an advanced instrument for quantitative measurements in the EUV spectral region that is based on the spatially resolved measurement of ionization products that it provides
We demonstrate an approach with which the measurement of the two-EUV-photon ionization cross section of Helium can be performed over a large intensity range using the image of the Helium ion distribution, which is produced by a table top EUV source
Summary
We demonstrate a tool for quantitative measurements in the extreme ultraviolet (EUV) spectral region measuring spatially resolved atomic ionization products at the focus of an EUV beam. The successful measurement of the generalized cross section demonstrates the potential of the approach in performing non-linear spectroscopic studies at EUV spectral range and provides experimental input to test the validity of the relevant theoretical models. For both EUV pulse metrology as well as for pump-probe investigations it is highly desirable to have a fast pulse duration characterization method. As in common optical 2nd order single-shot autocorrelators, what is needed to be recorded is the spatially resolved pattern of the products of the second order process induced by two crossed beams of the radiation to be characterized. The temporal profile of the radiation is mapped to the measured spatial distribution
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