Abstract
The Schottky barrier heights of Au and Ag contacts on the clean CdZnTe surfaces were measured by synchrotron radiation photoemission spectroscopy (SRPES). Meanwhile, the interface reactions between metals and CdZnTe were determined. The interface reaction was found to be a critical factor determining the barrier heights between metals and CdZnTe. Ohmic contact was obtained by electroless deposition of AuCl3 solution, and the interface chemical reaction and interface layer were analyzed. The CdTeO3 interface induced ohmic contact model is proposed to explain the electrical properties of electroless Au contacts with different treatments.
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