Abstract
The study of metals deposited on semiconductor surfaces is important to determine the chemical and electronic properties of these interfaces. In the present study, the formation of Pt GaP(110) interfaces at 150 and 300 K was monitored by core and valence level photoelectron spectroscopy using synchrotron radiation. Detailed analysis of band-bending reveals a strong surface photovoltage (SPV) effect, even at the higher temperature. The measured barrier height (φ bn = 1.5eV) is similar to values for chemically very different metal contacts on n-GaP(110). The temperature, metal coverage and photon flux dependence of the SPV is determined and interpreted in terms of calculations which consider the relevant current transport mechanism across the developing interface.
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