Abstract
During the measurement of structured light, different types of ambient light may cause some interference with the imaging process of grating projection. Therefore, this paper provides a descriptive method of the intensity of ambient light based on the polarization information. This method describes the degree of influence of ambient light on the grating projection system with the Mueller matrix of the target object and then processes the grating image in the frequency domain to reduce the influence of ambient light on the grating projection system. The final experimental results indicate the correctness of the proposed method.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
