Abstract
During the measurement of structured light, different types of ambient light may cause some interference with the imaging process of grating projection. Therefore, this paper provides a descriptive method of the intensity of ambient light based on the polarization information. This method describes the degree of influence of ambient light on the grating projection system with the Mueller matrix of the target object and then processes the grating image in the frequency domain to reduce the influence of ambient light on the grating projection system. The final experimental results indicate the correctness of the proposed method.
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