Abstract
Because of high-index contrast Si/SiO2 system, polarization sensitivity is a severe problem in photonic integration devices. In this paper, we design a integration devices comprised of polarization splitter-rotator (PSR) and germanium photo detectors (PDs) on chip. The integration of PSR and PD can realize the integrated layout which can realize the measurement of PSR polarization properties. After calculation, the on-chip loss of the polarization beam splitter is 1.19dB, and the polarization isolation of the system is 14.59dB/5.141dB in TE0/TM0 mode.
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