Abstract

AbstractWe have used atomic force microscopy (AFM) and Raman spectroscopy to investigate the development of the surface morphology of (001) direct and vicinal GaInP and GaInAs grown under conditions to produce strong CUPtB ordering. Raman spectroscopy provided direct evidence of CuPtB ordering in layers as thin as 10 nm for GaInP and 5 nm for GaInAs. We find that the morphology of GaInP and GaInAs on (001)6B substrates consists of ridges, which are aligned predominately along the [110] direction (A-direction). These ridges are well developed even at layer thicknesses of 2 nm, and their sides consist of step-bunches and near (001) terraces. On (001) direct substrates, the GaInP morphology is similar to that obtained on 6B substrates, although the step bunches have no preferential orientation, while GaInAs (001) growth proceeds by a combination of 2D-island and step flow growth. We discuss possible reasons for the differences in the morphology of ordered GaInP and GaInAs. The results of this work suggest it may be difficult to produce abrupt heterointerfaces in structures containing ordered GalnP and GaInAs alloys.

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