Abstract
The objective of this work is to assess the accuracy of different approaches to represent the microstructure of a polycrystalline sample using EBSD (electron backscatter diffraction) maps of a single external surface as input. To this aim, the stress and strain fields predicted using the finite element method and considering either columnar grains, extruded from the surface, or synthetic, obtained by random misorientation through the thickness of the surface grains, are compared with those calculated using the real microstructure, based on 3D-EBSD measurements.The material behaviour is obtained by a crystal plasticity finite element method (CPFEM). The material parameters in the CPFEM are calibrated by matching the experimental macroscopic stress-strain response of the material with a representative volume element (RVE) of the microstructure. The study shows that the columnar and synthetic 3D models estimate both the macroscopic behaviour and the surface strain and stress maps of the realistic model with precision. However, only the synthetic model can reproduce the variation of the longitudinal stress through the thickness of the material with acceptable accuracy.
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