Abstract
The influence of the titanium intermediate layer on the TiN coatings achieved by plasma-enchanced magnetron sputtering ion plating has been studied by means of Auger electron spectroscopy and transmission electron microscopy. The results indicate that there exists a transition layer of thickness 50 nm in the interface between the coating and substrate. It was also found that there are crystallographic orientations among α-Fe, FeTi, α-Ti, Ti 2N and TiN.
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