The influence of the pyramidal texture uniformity and process optimization on monocrystalline silicon solar cells

Abstract

To improve the photoelectric conversion efficiency of monocrystalline silicon solar cells, the influence of the pyramidal texture uniformity on the defects in the monocrystalline silicon cells was analyzed by simulation, and the uniformity of the pyramidal texture was quantitatively characterized with the uniformity coefficient. The texturing process parameters were optimized by fitting and optimizing the uniformity coefficient. In the experiments herein, four groups of textured monocrystalline silicon wafers were obtained by treating them with a 1.2% sodium hydroxide (NaOH) solution for four different times. The uniformity coefficient of each monocrystalline silicon wafer group was obtained. By fitting the uniformity coefficient, we obtained the texturing process parameters corresponding to the maximum uniformity coefficient. The experimental results show that the optimized monocrystalline silicon cell achieved a pyramidal texture with a maximum uniformity coefficient. In addition, the reflectivity of the monocrystalline silicon cell reached a minimum value, and the photoelectric conversion efficiency reached a maximum value. The uniformity coefficient can not only effectively quantify the uniformity of the pyramidal texture but also effectively optimize the texturing process parameters to improve the photoelectric conversion efficiency of monocrystalline silicon cells.