Abstract
In this study, we investigated the influence of Ta content (in Co 86Cr 12Ta 2 and Co 82Cr 13Ta 5 compositions) on magnetic and structural properties of Co–Cr–Ta perpendicular media samples grown on Si substrates at different substrate temperatures during RF-sputter deposition. In general, coercivity of Co 82Cr 13Ta 5 samples is higher than that of Co 86Cr 12Ta 2 samples, whereas the perpendicular c-axis orientation of Co 86Cr 12Ta 2 samples is better. Ta content was suggested to be in between 2 and 5 at% to give optimum magnetic and structural properties.
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