Abstract
PFO thin films made of toluene solution dissolved for 12, 30 and 80min at 55°C were prepared and then treated by solvent vapor annealing or thermal annealing. Their absorption, photoluminescence, electroluminescence and morphology were characterized. The results show that the thin film made of solution dissolved for short time contains trace β phase PFO that lead to unusual emission. After solvent vapor annealing or thermal annealing, luminescence of such thin film is lower than that made of solution dissolved for long time. The surface morphology shows that such thin film contains large aggregations with size of 120×80nm, which is in line with the light scattering results of 120nm large particles in the solution, indicating the difference of luminescence originate from the residue aggregations. Such aggregations will lead to stronger diffraction peak in the in-plane GIXRD and weaker diffraction peak in the out-of-plane GIXRD, which indicates they have more ordered structure in main chain direction that will hinder the formation of ordered packing of PFO molecular chains in out-of-plane direction. These results demonstrate that the PFO solution needs to be dissolved for enough time to realize repeatment of high quality light-emitting device for actual massive application.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
