Abstract
The secondary ion (SI) emission behavior of pure polymer systems is meanwhile well understood. However, common plastics not only consist of the polymer host material but also contain a variety of additives normally present in low concentrations only. In order to better understand the parameters governing the SI emission of these trace compounds we performed a systematic study on the influence of the analysis parameters (primary ion (PI) type, PI energy, electron bombardment for charge compensation, etc.) using model systems. Samples were prepared by spin coating (sub)monolayers of Irganox 1010 onto additive-free low density polyethylene (LDPE). The SI parameters yield, disappearance cross-section and efficiency (yield per damaged area) were determined for PI bombardment with Ga +, Cs +, and SF 5 +. Furthermore the damaging influence of electron bombardment for charge compensation on the organic surface layers was investigated.
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