Abstract
The dependence of the reflectivity coefficients of ZnTe textured thin films evaporated under various conditions in the energy range 3–6 eV was investigated. The analysed reflectivity spectra of thin films were compared with the reflection spectra of ideal monocrystals. Careful examination of these results suggests the influence of internal randomly distributed stresses introduced into the samples during the evaporation process and the cooling of the thin film-substrate system.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
