Abstract
Microstructure evolution in commercial-purity titanium (CP Ti) with various initial grain sizes (1, 7, 15, and 30 μm) during plane-strain multipass rolling to a true thickness strain of 2.66 at 293 K (20 °C) was established. The degree of deformation twinning was found to be strongly dependent on grain size. Twinning was rare in the material with a grain size of 1 μm. For all grain sizes >15 μm, the occurrence of twinning reached a similar, maximum level. Concurrently, the propensity for twinning enhanced the kinetics of microstructure refinement particularly for the initially coarse-grain materials. Due to the extensive twinning-induced microstructure refinement, rolling of coarse-grain (15 μm) CP Ti to a true thickness strain of 2.66 resulted in the formation of an ultrafine microstructure with a grain/subgrain size of 200-300 nm, a value similar to that attained for the initially micrometer-scale microstructure. The effect of grain size on twinning in titanium was discussed in the context of a disclination model.
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