Abstract
In this contribution, we examine the influence of emitter conditioning for a <111> tungsten cold field emission gun on the emission and beam characteristics of a double aberration corrected electron microscope. By varying the post flash build-up parameters we can control the effective emitter tip radius. A sharp emitter yields an energy resolution of 0.31eV but relatively low beam current whereas an increased tip radius results in a reduction in energy resolution to 0.4eV but much higher potential beam current. Consequently, careful control of the build-up parameters can be used as a means of tailoring the emission to suit specific instrumental requirements.
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