The influence of electronic transport across interface junction between Si substrate and the root of ZnO micro-prism on field emission performance

Abstract

ZnO micro-prisms are prepared on the p-type and n-type Si substrates, separately. The I–V curves analysed by AFM show that the interface junctions between the ZnO micro-prisms and the p-type substrate and between the ZnO micro-prisms and the n-type Si substrate exhibit p–n junction behaviour and ohmic contact behaviour, respectively. The formation of the p–n heterojunction and ohmic contact is ascribed to the intrinsic n-type conduction of ZnO material. Better field emission performance (lower onset voltage and larger emission current) is observed from an individual ZnO micro-prism grown on the n-type Si substrate. It is suggested that the n-Si/n-ZnO interfacial ohmic contact benefits the electron emission; while the p-Si/n-ZnO interface heterojunction deteriorates the electron emission.