Abstract
Since many applications of electron energy loss spectroscopy (EELS) deal with microanalysis of crystalline materials it is relevant to consider the effects of diffracting conditions on an EELS measurement. It is well known that anamolous effects can be observed during thin film x-ray microanalysis when crystalline materials are oriented under diffracting conditions near S = 0.1-4 It is not surprizing, therefore, that similar effects will be present in EELS, since this anamolous x-ray generation is a result of variations in the ionization cross-section with crystalline orientation2,3. Furthermore since multiple scattering effects quickly average out these perturbations2 one expects the most pronounced effects under conditions appropriate to EELS.5
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