The influence of defects in excision and error prone repair on spontaneous and induced mitotic recombination and mutation in Saccharomyces cerevisiae

Abstract

Spontaneous and induced mitotic crossingover, mitotic gene conversion and point mutation were studied in a set of diploid strains of Saccharomyces cerevisiae carrying rad3, lacking excision repair, or rad6, lacking error prone repair, or fully repair competent. All three endpoints could be studied in one and the same strain. Spontaneous frequencies of mitotic gene conversion were increased fourfold in rad3 and tenfold in rad6, for mitotic crossing-over the factors of increase were at least five and twenty times. Reverse mutation frequencies were increased threefold in rad3 but normal in rad6. Induction of reverse mutation by ultraviolet light and EMS was completely blocked in rad6 and strongly reduced with nitrous acid. In contrast to this, rad3 increased the inducibility by all three mutagens. These mutagens also induced in rad3 and rad6 mitotic gene conversion at much lower doses than in wild type. However in rad3, induction of mitotic gene conversion by ultraviolet light did not show a very strong increase. Mitotic crossing-over could be induced to the same high level in all strains but at much lower doses in rad3 and rad6. The design of the strains allowed for the study of repair during or after the first post-treatment DNA-synthesis. Even though it could be induced at lower doses than in wild type, the final levels observed were the same in all strains. It was concluded that excision repair of pyrimidine dimers is not required for mitotic gene conversion but the lack of excision reduces ultraviolet light induced gene conversion. The data suggest that the repair pathway represented by rad6, error prone repair, competes strongly with repair activities responsible for mitotic recombination.