Abstract
The resistive transitions of (Bi,Pb)2Sr2Ca2Cu3−xCrxOy silver sheathed tapes with x = 0.0, 0.0005, 0.001, 0.002, 0.004 have been measured under applied magnetic fields orientedperpendicular to the tape plane from 0 to 7 T. The transitions are in good agreement withthe thermally activated flux creep model by Anderson and Kim:R(T,H) = R0exp[−U(H)/kBT] in the low resistance range. Under lower applied magnetic field, the calculated activation energiesU(H) of fluxmotion increased drastically in samples with the proper amount of Cr-ion defects. For our samples, thevalues of U are all well fitted with the law . With the doped Cr-ion defects, the values ofα increase from 0.66 to about 1. In particular, the tape withx = 0.004 has adifferent α value in a different magnetic field range:α is about 0.67 whenH<0.133 T, and about 0.95when H>0.133 T. This markedlychanged value of α indicates flux creep according to various mechanisms in these tapes.
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