Abstract
The influence of built-in electrostatic potential of interface dipole on barrier energies for the emission and capture of electrons by InGaAs/GaAs quantum dots (QDs) has been found. It was shown that the formation of the interface dipole from carriers localized in QDs and ionized deep level defects depended on isochronous annealing under bias-on-bias-off cooling conditions. The dependence of the height of the capture barrier on the filling pulse duration, related to a manifestation of the Coulomb blockade effects on the capture of electrons into the ground and excited states of the dots, has also been revealed.
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