Abstract
A polycrystalline CdTefilms have been prepared by thermal evaporation technique on glass substrate at room temperature. The films thickness was about700±50 nm. Some of these films were annealed at 573 K for different duration times (60, 120 and 180 minutes), and other CdTe films followed by a layer of CdCl2 which has been deposited on them, and then the prepared CdTe films with CdCl2 layer have been annealed for the same conditions. The structures of CdTe films without and with CdCl2 layer have been investigated by X-ray diffraction. The as prepared and annealed films without and with CdCl2 layer were polycrystalline structure with preferred orientation at (111) plane. The better structural properties have been observed in presence of CdCl2 layer. The D.C conductivity for CdTe films with CdCl2 layershowed higher values. The electrical activation energy influenced with increasing duration times of annealing. Hall Effect measurement was indicated that all CdTe films are p-type. The carrier concentration, Hall mobility and the carrier life time wereaffected by increasing duration times of annealing.
Highlights
Photovoltaic has the potential to become a major source of energy and to have a significant effect on the global environment, due to its basic optical, electronic and chemical properties [1]
The films thickness was about700±50 nm. Some of these films were annealed at 573 K for different duration times (60, 120 and 180 minutes), and other Cadmium Telluride (CdTe) films followed by a layer of CdCl2 which has been deposited on them, and the prepared CdTe films with CdCl2 layer have been annealed for the same conditions
The spectrum of the CdTe powder and films have been compared with ASTM cards of CdTe structure which give a polycrystalline structure containing a mixture of hexagonal and cubic phases, similar data had been obtained by many researchers [10,11,12,13,14]
Summary
A polycrystalline CdTefilms have been prepared by thermal evaporation technique on glass substrate at room temperature. Some of these films were annealed at 573 K for different duration times (60, 120 and 180 minutes), and other CdTe films followed by a layer of CdCl2 which has been deposited on them, and the prepared CdTe films with CdCl2 layer have been annealed for the same conditions. The structures of CdTe films without and with CdCl2 layer have been investigated by X-ray diffraction. The as prepared and annealed films without and with CdCl2 layer were polycrystalline structure with preferred orientation at (111) plane. CdTe films, Thermal Evaporation, X- Ray Diffraction, D.C conductivity, Hall Effect. تم تحضير اغشية الكادميوم تيلورايد الرقيقة المتعددة التبلور بواسطة تقنية التبخير الحراري على ارضيات زجاجية 07( وقد تم تلدين بعض هذه الاغشية بازمنة تلدين مختلفة. نانومتر07±077 وكان سمك الاغشية بحدود.بدرجة حرارة الغرفة و بعد ذلك تم, اما باقي اغشية الكادميوم تيلورايد فقد تم ترسيب طبقة من ثنائي كلوريد الكادميوم عليها,) دقيقة087 و027و وقد تم فحص التركيب البلوري لاغشية الكادميوم تيلورايد الملدنة و غير الملدنة مع و.تلدينها بنفس الفترات الزمنية السابقة وكانت جميع الاغشية ذات تركيب متعدد التبلور و اتجاهية مفضلة.بدون ثنائي كلوريد الكادميوم بواسطة حيود الاشعة السينية وقد اظهرت اغشية الكادميوم. كما ان افضل خواص تركيبية كانت مع وجود طبقة ثنلئي كلوريد الكادميوم.000 للمستوي وكانت قيم طاقة التنشيط متقلبة مع.تيلورايد المحضرة بوجود طبقة من ثنائي كلوريد الكادميوم أعلى قيم للتوصيلة المستمرة كما وان تركيز الحاملات. أما قياسات تاثير هول فقد أظهرت ان جميع الاغشية هي من النوع القابل.زيادة الفترة الزمنية للتلدين
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