Abstract
In the present paper, conventional transmission electron microscope (CTEM) and high resolution transmission electron microscopy (HRTEM) were used to study the influence of boron additions on the microstructure of polycrystalline and single crystal NiAl alloys. The local chemistry of precipitate particles observed in boron-doped NiAl was investigated by scanning transmission electron microscope (STEM). During the course of this research, microstructural changes induced in the NiAl by the high energy electron beam were observed. Plate-like precipitates are present in NiAl single crystals and polycrystals doped with boron. Since these precipitates were not seen in boron-free NiAl alloys, they may be a boride compound containing Fe in the NiAl single crystals and Ti, V, Cr, Mn and Fe in the polycrystalline NiAl. The high energy electron beam stimulates a phase transformation which is manifested by the appearance of tweed structure and extra diffuse scattering in the electron diffraction patterns.
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