Abstract
Post-deposition annealing was performed on trilayer films consisting of a C overcoat layer on top of CoCrPt/CrTi/glass substrate. We observed a coercivity of 3600Oe in the films with a 4nm C overcoat, which was about three times larger than the coercivity of similar films without a C overcoat. This is most likely due to the significant decrease in intergranular exchange coupling for the films with C overcoat, as shown by the annealing treatment. It is believed that the diffusion of C into CoCrPt grain boundaries promotes magnetic grain isolation.
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