Abstract
Sputter-deposited CuAl films have been exposed indoors. Corrosion products were analysed by chronopotentiometric analysis, electrical contact resistance measurements, reflectance measurements and visual inspection. Tarnishing is inhibited on CuAl films with respect to pure copper films. The tarnish film does contain cuprous oxide but cuprous sulphide is not found. The inhibiting action is attributed to cuprous ion diffusion inhibition in an aluminium-doped cuprous oxide film.
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