Abstract
An improved resonator method for determination of the complex permittivity of materials in a reflective resonator is presented. The method is specific in the following. In the obtained relationship, imaginary part e2 of the permittivity of an investigated material is determined using the variation of the resonance frequency and coupling coefficient of the resonator observed when a specimen is introduced, which increases the measurement accuracy. The method is approbated in the investigations of high-resistance silicon specimens.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Communications Technology and Electronics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
