Abstract
This work investigated the thermoelectric properties of Cu2ZnSnS4 (CZTS) thin films deposited on the soda-lime glass using spin-coating techniques with different layers. X-ray diffraction (XRD) pattern confirms the increase of the layer number leads to improve the crystallite size and all the films exhibit tetragonal structure with the presence of secondary phases. EDX shows a reduction of Cu and Zn contents while an increase in Sn contents is observed when the thickness increases. Surface topography is also carried out to study the surface roughness and it is found to be minimum when we deposit 4 layers. The absorption spectra show that CZTS exhibit a bandgap varied between 1.33 and 1.9 eV, the resistivity and the Seebeck coefficient have been found to increase with the increase of surface roughness. This investigation indicates that Cu2ZnSnS4 thin films can be a suitable material for thermoelectric application at near room temperature range.
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