Year-end Sale % OFF 
Abstract
A new general analytical method is suggested for identifying a crystal system from a powder X-ray pattern with a computer. The formulae relating interferential indices and interplanar spacing of a line with the definite ratio of parameters of the Bravais cell for each crystal system are given. The identification of the system is carried out by selection of three definite lines, indices and interface distances, all of which satisfy the corresponding formulae.
Published Version (
Free)
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
