Abstract
The hypergeometric distribution model for predicting the reliability of softwares : Huang Xi Zhi. Microelectron. Reliab.24, 11 (1984)
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https://doi.org/10.1016/0026-2714(85)90054-x
Journal: Microelectronics Reliability | Publication Date: Jan 1, 1985 |
The hypergeometric distribution model for predicting the reliability of softwares : Huang Xi Zhi. Microelectron. Reliab.24, 11 (1984)
Join us for a 30 min session where you can share your feedback and ask us any queries you have