The high-temperature thermal expansion of Ni3Al measured by X-ray diffraction and dilation methods

Abstract

The lattice parameters of Ni3Al have been determined accurately for the temperature range 25 to 594 degrees C by a high-temperature X-ray powder diffraction method. These data are used to evaluate the coefficients of thermal expansion at various temperatures. The thermal expansion of Ni3Al has also been measured from 25 to 1000 degrees C by a dilation method. The thermal expansion values obtained by the dilation method are in good agreement with those determined by the X-ray diffraction method at around room temperature, but the agreement deteriorates with increase in temperature.