The helium microwave-induced plasma: an alternative ion source for plasma mass spectrometry

Abstract

Helium microwave-induced plasmas are a useful alternative ion source for plasma mass spectrometry in certain applications including nonmetal detection. A review of investigations concerning helium microwave-induced plasma mass spectrometry is presented. The advantages of helium plasmas are discussed and initial MIP-MS work is reviewed. Both gaseous and aqueous sample introduction techniques are discussed including chromatographic techniques, electrothermal vaporization and solution nebulization. In addition, other studies including fragmentation and fundamentals are reviewed.