Abstract
The Hall coefficients, the electrical resistivities and the temperature coefficients of resistivity of aluminium films were measured simultaneously in situ. Conduction predominantly by holes was observed in aluminium films. The effect of grain boundary scattering on the electrical resistivity was accounted for in the light of the Mayadas-Shatzkes theory. A positive Hall coefficient was also found for cadmium films. It was observed that in view of the quasi-whisker-like growth in cadmium films and the strong anisotropy in their properties, the Fuchs-Sondheimer relation should not be used to analyse the data.
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