Abstract
We examined the influence of film thickness and composition on the effective Tg of compatible thin film mixtures of polystyrene (PS) and tetramethylbisphenol-A polycarbonate (TMPC) on SiOx/Si substrates using spectroscopic ellipsometry. Our measurements reveal that while the Tg of TMPC films increased with decreasing film thickness, h, the effective Tg of thin film mixtures of PS and TMPC decreased with decreasing film thickness. In these mixtures, Tg was independent of film thickness at large h. We also found that while the Tg of bulk mixtures of TMPC/PS exhibited large negative deviations from additivity with composition, such deviations were negligible in the thin film mixtures. The thickness dependence of Tg is compared with theory.
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