Abstract
AbstractA simple and accurate graphical method is described for converting the composition of ternary alloys from weight per cent to atomic per cent, and vice versa. By making certain simplifying assumptions, the principles of the method are extended to the approximate determination of ternary alloy compositions from the count fractions obtained from fluorescence X-ray spectra. An example is given for the not-so-favorable system bismuth-germanium-tellurium. On account of the simpler excitation conditions, the same procedures may also be applied to X-ray microprobe analysis.
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