Abstract
The method of absolute-retardation measurements does not depend upon the use of any specific interferometer. Any one of the many extended field interferometers can be employed, including the Series, Michelson, Mach-Zehnder and Fizeau types. Where adequate monochromatic purity of light source is available, reflections from the two surfaces of the model can form the interferogram, thus dispensing with the necessity of any separate optical interferometer.
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