The FTS atomic spectrum tool (FAST) for rapid analysis of line spectra

Abstract

The FTS Atomic Spectrum Tool (FAST) is an interactive graphical program designed to simplify the analysis of atomic emission line spectra obtained from Fourier transform spectrometers. Calculated, predicted and/or known experimental line parameters are loaded alongside experimentally observed spectral line profiles for easy comparison between new experimental data and existing results. Many such line profiles, which could span numerous spectra, may be viewed simultaneously to help the user detect problems from line blending or self-absorption. Once the user has determined that their experimental line profile fits are good, a key feature of FAST is the ability to calculate atomic branching fractions, transition probabilities, and oscillator strengths–and their uncertainties–which is not provided by existing analysis packages. Program SummaryProgram title: FAST: The FTS Atomic Spectrum ToolCatalogue identifier: AEOW_v1_0Program summary URL: http://cpc.cs.qub.ac.uk/summaries/AEOW_v1_0.htmlProgram obtainable from: CPC Program Library, Queen’s University, Belfast, N. IrelandLicensing provisions: GNU General Public License version 3No. of lines in distributed program, including test data, etc.: 293058No. of bytes in distributed program, including test data, etc.: 13809509Distribution format: tar.gzProgramming language: C++.Computer: Intel x86-based systems.Operating system: Linux/Unix/Windows.RAM: 8 MB minimum. About 50–200 MB for a typical analysis.Classification: 2.2, 2.3, 21.2.Nature of problem:Visualisation of atomic line spectra including the comparison of theoretical line parameters with experimental atomic line profiles. Accurate intensity calibration of experimental spectra, and the determination of observed relative line intensities that are needed for calculating atomic branching fractions and oscillator strengths.Solution method:FAST is centred around a graphical interface, where a user may view sets of experimental line profiles and compare them to calculated data (such as from the Kurucz database [1]), predicted line parameters, and/or previously known experimental results. With additional information on the spectral response of the spectrometer, obtained from a calibrated standard light source, FT spectra may be intensity calibrated. In turn, this permits the user to calculate atomic branching fractions and oscillator strengths, and their respective uncertainties.Running time:Open ended. Defined by the user.