Abstract
Fractal structures were observed in discontinuous Cu films evaporated onto quartz-glass substrates in vacuo (10 −8 Torr). On the basis of electron micrographs, the coverage coefficients, fractal dimensions D and correlation lengths ξ were determined for the Cu films with coverage coefficients p ranging from 0.3 to 1. The correlation function method was used to determine the fractal dimensions for the experimental, as well as for the computer modelled films. In the percolation range some critical exponents (β, ν) were determined. The results were compared with the values theoretically predicted, and with the results previously obtained.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
