Abstract
Dislocation debris in Ni–23.5Al–0.2B specimens deformed at 77 K is dominated by superlattice intrinsic stacking faults (SISFs) which form from antiphase boundary (APB) coupled dislocations. Based on our transmission electron microscopy (TEM) observations, two new mechanisms are proposed for the formation of “type I” SISF dislocations. SISFs are believed to make a significant contribution to the flow stress of 0.2 at% boron doped Ni3Al at low temperature.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
