Abstract
The paper extends the classical d-algorithm in the time domain. The proposed method makes it possible to generate the tests of faults only detectable in transients (e.g. faults of monostable functions, stuck-at faults of statically redundant elements) in digital networks. The field of applicability: testing small to medium sized combinational and asynchronous networks, microelectronic circuits.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
