Abstract

The increase of array size and decrease of cell size make the testing of infrared focal plane arrays (FPAs) difficult. A design for test scheme, cross-check test, for infrared FPAs is presented in this paper. For an array size of M by N, the testing times can be reduced from the order of M*N to M+N. An analysis of the fault detectability of the proposed test scheme is also presented in this paper.

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