Abstract
AbstractIn this paper the factorization method from inverse scattering theory and impedance tomography is extended to a class of general elliptic differential equations in divergence form. The inverse problem is to determine the interface ∂Ω of an interior change of the material parameters from the Neumann‐Dirichlet map. Since absorption is allowed a suitable combination of the real and imaginary part of the Neumann‐Dirichlet map is needed to explicitely characterize Ω by the data. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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